Scintillator-based ion beam profiler for diagnosing laser-accelerated ion beams

Green, J. S. and Borghesi, M. and Brenner, C. M. and Carroll, D. C. and Dover, N. P. and Foster, P. S. and Gallegos, P. and Green, S. and Kirby, D. and Kirkby, K. J. and McKenna, P. and Merchant, M. J. and Najmudin, Z. and Palmer, C. A. J. and Parker, D. and Prasad, R. and Quinn, K. E. and Rajeev, P. P. and Read, M. P. and Romagnani, L. and Schreiber, J. and Streeter, M.J.V. and Tresca, O. and Wahlström, C. G. and Zepf, M. and Neely, D. (2011) Scintillator-based ion beam profiler for diagnosing laser-accelerated ion beams. Proceedings of SPIE - The International Society for Optical Engineering, 8079. 807919. ISSN 0277-786X (https://doi.org/10.1117/12.888967)

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Abstract

Next generation intense, short-pulse laser facilities require new high repetition rate diagnostics for the detection of ionizing radiation. We have designed a new scintillator-based ion beam profiler capable of measuring the ion beam transverse profile for a number of discrete energy ranges. The optical response and emission characteristics of four common plastic scintillators has been investigated for a range of proton energies and fluxes. The scintillator light output (for 1 MeV > Ep < 28 MeV) was found to have a non-linear scaling with proton energy but a linear response to incident flux. Initial measurements with a prototype diagnostic have been successful, although further calibration work is required to characterize the total system response and limitations under the high flux, short pulse duration conditions of a typical high intensity laser-plasma interaction.

ORCID iDs

Green, J. S., Borghesi, M., Brenner, C. M., Carroll, D. C., Dover, N. P., Foster, P. S., Gallegos, P., Green, S., Kirby, D., Kirkby, K. J., McKenna, P. ORCID logoORCID: https://orcid.org/0000-0001-8061-7091, Merchant, M. J., Najmudin, Z., Palmer, C. A. J., Parker, D., Prasad, R., Quinn, K. E., Rajeev, P. P., Read, M. P., Romagnani, L., Schreiber, J., Streeter, M.J.V., Tresca, O., Wahlström, C. G., Zepf, M. and Neely, D.;