Accelerated degradation tests planning with competing failure modes

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Zhao, Xiujie and Xu, Jianyu and Liu, Bin (2018) Accelerated degradation tests planning with competing failure modes. IEEE Transactions on Reliability, 67 (1). pp. 142-155. ISSN 0018-9529 (https://doi.org/10.1109/TR.2017.2761025)

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Abstract

Accelerated degradation tests (ADT) have been widely used to assess the reliability of products with long lifetime. For many products, environmental stress not only accelerates their degradation rate but also elevates the probability of traumatic shocks. When random traumatic shocks occur during an ADT, it is possible that the degradation measurements cannot be taken afterward, which brings challenges to reliability assessment. In this paper, we propose an ADT optimization approach for products suffering from both degradation failures and random shock failures. The degradation path is modeled by a Wiener process. Under various stress levels, the arrival process of random shocks is assumed to follow a nonhomogeneous Poisson process. Parameters of acceleration models for both failure modes need to be estimated from the ADT. Three common optimality criteria based on the Fisher information are considered and compared to optimize the ADT plan under a given number of test units and a predetermined test duration. Optimal two- and three-level optimal ADT plans are obtained by numerical methods. We use the general equivalence theorems to verify the global optimality of ADT plans. A numerical example is presented to illustrate the proposed methods. The result shows that the optimal ADT plans in the presence of random shocks differ significantly from the traditional ADT plans. Sensitivity analysis is carried out to study the robustness of optimal ADT plans with respect to the changes in planning input.

ORCID iDs

Zhao, Xiujie, Xu, Jianyu and Liu, Bin ORCID logoORCID: https://orcid.org/0000-0002-3946-8124;
  • Item type:Article
    ID code:66873
    Dates:
    Date
    Event
    31 March 2018
    Published
    31 October 2017
    Published Online
    30 September 2017
    Accepted
    Notes:© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
    Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
    Department:Strathclyde Business School > Management Science
    Depositing user: Pure Administrator
    Date deposited:08 Feb 2019 13:11
    Last modified:17 Dec 2024 21:23
    Related URLs:
    URI:https://strathprints.strath.ac.uk/id/eprint/66873
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