Single atom imaging with an sCMOS camera
Picken, C.J. and Legaie, R. and Pritchard, J. D. (2017) Single atom imaging with an sCMOS camera. Applied Physics Letters, 111 (16). 164102. ISSN 0003-6951 (https://doi.org/10.1063/1.5003304)
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Abstract
Single atom imaging requires discrimination of weak photon count events above background and has typically been performed using either EMCCD cameras, photomultiplier tubes or single photon counting modules. sCMOS provides a cost effective and highly scalable alternative to other single atom imaging technologies, offering fast readout and larger sensor dimensions. We demonstrate the first single atom resolved imaging of two site-addressable single atom traps separated by 10 μm using an sCMOS camera, offering a competitive signal-to-noise ratio at intermediate count rates to allow high fidelity readout discrimination (error < 10−6) and sub-μm spatial resolution for applications in quantum technologies.
ORCID iDs
Picken, C.J. ORCID: https://orcid.org/0000-0002-7194-8398, Legaie, R. ORCID: https://orcid.org/0000-0002-7141-8338 and Pritchard, J. D. ORCID: https://orcid.org/0000-0003-2172-7340;-
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Item type: Article ID code: 61942 Dates: DateEvent16 October 2017Published5 October 2017AcceptedNotes: The following article has been accepted by Applied Physics Letters: Picken, CJ, Legaie, R & Pritchard, JD 2017, 'Single atom imaging with an sCMOS camera' Applied Physics Letters, pp. 1-5. After it is published, it will be found at http://aip.scitation.org/journal/apl/. Subjects: Science > Physics Department: Faculty of Science > Physics Depositing user: Pure Administrator Date deposited: 06 Oct 2017 11:20 Last modified: 11 Nov 2024 11:48 Related URLs: URI: https://strathprints.strath.ac.uk/id/eprint/61942