Measurement of temperature-dependent relaxation oscillation frequency and linewidth enhancement factor of a 1550 nm VCSEL

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Khan, Nadir Ali and Schires, Kevin and Hurtado, Antonio and Henning, Ian D. and Adams, Michael J. (2013) Measurement of temperature-dependent relaxation oscillation frequency and linewidth enhancement factor of a 1550 nm VCSEL. IEEE Journal of Quantum Electronics, 49 (11). pp. 990-996. 6605534. ISSN 0018-9197 (https://doi.org/10.1109/JQE.2013.2282759)

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Abstract

In this paper, we present detailed measurements of the temperature- dependent relaxation oscillation frequency and polarization resolved linewidth enhancement factor (α) of a 1550-nm vertical cavity surface emitting laser (VCSEL). The thermal effects on these parameters are investigated for a temperature range of -20 °C to 60 °C.. Comparison is made between the experimental observations and theoretical predictions for similar VCSELs and with those different in operating wavelength and/or materials.

ORCID iDs

Khan, Nadir Ali, Schires, Kevin, Hurtado, Antonio ORCID logoORCID: https://orcid.org/0000-0002-4448-9034, Henning, Ian D. and Adams, Michael J.;
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