Prognostic modeling for electrical treeing in solid insulation using pulse sequence analysis

Nur Hakimah Binti Ab Aziz, N and Catterson, Victoria and Judd, Martin and Rowland, S.M. and Bahadoorsingh, S. (2014) Prognostic modeling for electrical treeing in solid insulation using pulse sequence analysis. In: 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena, 2014-10-19 - 2014-10-22. (https://doi.org/10.1109/CEIDP.2014.6995906)

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Abstract

This paper presents a prognostic framework for estimating the time-to-failure (TTF) of insulation samples under electrical treeing stress. The degradation data is taken from electrical treeing experiments on 25 epoxy resin samples. Breakdown occurs in all tests within 2.5 hours. Partial discharge (PD) data from 18 samples are used as training data for prognostic modeling and 7 for model validation. The degradation parameter used in this model is the voltage difference between consecutive PD pulses, which decreases prior to breakdown. Every training sample shows a decreasing exponential trend when plotting the root mean squared (RMS) of the voltage difference for 5 minute batches of data. An average model from the training data is developed to determine the RMS voltage difference during breakdown. This breakdown indicator is verified over three time horizons of 25, 50 and 75 minutes. Results show the best estimation of TTF for 50 minutes of data, with error within quantified bounds. This suggests the framework is a promising approach to estimating insulation TTF.

  • Item type:Conference or Workshop Item(Paper)
    ID code:49307
    Dates:
    Date
    Event
    October 2014
    Published
    30 April 2014
    Accepted
    Notes:(c) 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.
    Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
    Department:Faculty of Engineering > Electronic and Electrical Engineering
    Depositing user: Pure Administrator
    Date deposited:19 Sep 2014 16:00
    Last modified:20 Apr 2024 01:00
    Related URLs:
    URI:https://strathprints.strath.ac.uk/id/eprint/49307
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