A simple defect detection technique for high speed roll-to-roll manufacturing

Krysinski, Adam and Coupland, Jeremy and Leach, Richard and Flockhart, Gordon M. H. (2014) A simple defect detection technique for high speed roll-to-roll manufacturing. In: 14th euspen International Conference, 2014-06-02 - 2014-06-06. (Unpublished)

Full text not available in this repository.Request a copy

Abstract

A prototype industrial defect inspection system, which can operate at speeds of up to 1 ms-1 and over web widths of 500 mm, is being developed at the National Physical Laboratory for roll-to-roll manufacturing of highly-transparent materials. The prototype is designed to detect defects with lateral dimensions larger than 10 μm. The findings of a feasibility study for a sensor based on dark-field imaging principles are presented. The design of the sensor is introduced and the results of a preliminary characterisation are discussed. Off-the-shelf equipment was used including a monochromatic CMOS sensor paired with a telecentric lens. The illumination was supplied from a high-power LED and a range of illumination wavelengths was used. The characterisation was performed on custom-made transparent polymer artefacts and the results are presented.

ORCID iDs

Krysinski, Adam, Coupland, Jeremy, Leach, Richard and Flockhart, Gordon M. H. ORCID logoORCID: https://orcid.org/0000-0002-8777-7511;
CORE (COnnecting REpositories)