Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM

Gosvami, N. and Lau, K. H. A. and Sinha, S. K. and O'Shea, S. J. (2006) Effect of end groups on contact resistance of alkanethiol based metal-molecule-metal junctions using current sensing AFM. Applied Surface Science, 252 (11). pp. 3956-3960. ISSN 0169-4332 (https://doi.org/10.1016/j.apsusc.2005.09.050)

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Abstract

Tuning the charge transport through a metal-molecule-metal junction by changing the interface properties is widely studied and is of paramount importance for applications in molecular electronic devices. We used current sensing atomic force microscopy (CSAFM) as a tool to study the contact resistance of metal-molecule-metal (MmM) junctions formed by sandwiching self-assembled monolayers (SAMs) of alkanethiols with various end groups (-CH3, -OH and -NH2) between Au(111) substrates and An coated AFM tips. The effect of interface chemistry on charge transport through such SAMs with varying end groups was studied in an inert, non-polar liquid (hexadecane) environment. We find that the contact resistances of these MmM junctions vary significantly based on the end group chemistry of the molecules. (c) 2005 Elsevier B.V. All rights reserved.

  • Item type:Article
    ID code:45506
    Dates:
    Date
    Event
    31 March 2006
    Published
    Notes:M1 - 11 Times Cited: 5 3rd International Conference on Materials for Advanced Technologies/9th International Conference on Advanced Materials Jul 03-08, 2005, Singapore, SINGAPORE
    Subjects:Science > Chemistry
    Department:Faculty of Science > Pure and Applied Chemistry
    Depositing user: Pure Administrator
    Date deposited:30 Oct 2013 12:58
    Last modified:08 Apr 2024 20:53
    URI:https://strathprints.strath.ac.uk/id/eprint/45506
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