Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation

Tools

Ding, W. and Gorbach, A.V. and Wadsworth, W.J. and Knight, J.C. and Skryabin, D.V. and Strain, M.J. and Sorel, M. and De La Rue, R.M. (2011) Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation. In: 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011, 2011-05-22 - 2011-05-26. (https://doi.org/10.1109/CLEOE.2011.5943163)

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Abstract

Silicon photonics has attracted much attention [1]. While spectral measurements of nonlinear processes in subwavelength silicon-on-insulator (SOI) waveguides have been well reported, time-domain or simultaneous time-and-frequency characterization is required to fully characterize effects like soliton formation [2,3].

ORCID iDs

Ding, W., Gorbach, A.V., Wadsworth, W.J., Knight, J.C., Skryabin, D.V., Strain, M.J. ORCID logoORCID: https://orcid.org/0000-0002-9752-3144, Sorel, M. and De La Rue, R.M.;
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