The application of principal component analysis to study TSDC spectra
Given, M.J. and Fouracre, R.A. and Banford, H. (2003) The application of principal component analysis to study TSDC spectra. In: Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), 2003-10-19 - 2003-10-22. (http://dx.doi.org/10.1109/CEIDP.2003.1254824)
Full text not available in this repository.Request a copyAbstract
The technique of principal component analysis has been applied to spectra obtained by thermally stimulated discharge current measurements on polyimide films. The films had been aged by gamma irradiation followed by long term exposure to elevated temperatures. The relationship between the aging history and the changes observed in the principal component values derived from the spectra are discussed.
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Item type: Conference or Workshop Item(Paper) ID code: 39244 Dates: DateEventOctober 2003PublishedKeywords: application, principal component, analysis, study, tsdc spectra, aging , temperature , solids, principal component analysis, polyimides, inductors, history, dielectric measurements, current measurement , chemicals, Electrical Engineering. Electronics Nuclear Engineering Subjects: Technology > Electrical engineering. Electronics Nuclear engineering Department: Faculty of Engineering > Electronic and Electrical Engineering Depositing user: Pure Administrator Date deposited: 18 Apr 2012 14:28 Last modified: 05 Jan 2024 05:17 URI: https://strathprints.strath.ac.uk/id/eprint/39244
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