The application of principal component analysis to study TSDC spectra

Given, M.J. and Fouracre, R.A. and Banford, H. (2003) The application of principal component analysis to study TSDC spectra. In: Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), 2003-10-19 - 2003-10-22. (http://dx.doi.org/10.1109/CEIDP.2003.1254824)

Abstract

The technique of principal component analysis has been applied to spectra obtained by thermally stimulated discharge current measurements on polyimide films. The films had been aged by gamma irradiation followed by long term exposure to elevated temperatures. The relationship between the aging history and the changes observed in the principal component values derived from the spectra are discussed.

ORCID iDs

Given, M.J. ORCID: https://orcid.org/0000-0002-6354-2486

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• Item metadata

  Item type:	Conference or Workshop Item(Paper)
  ID code:	39244
  Dates:	Date Event October 2003 Published
  Subjects:	Technology > Electrical engineering. Electronics Nuclear engineering
  Department:	Faculty of Engineering > Electronic and Electrical Engineering
  Depositing user:	Pure Administrator
  Date deposited:	18 Apr 2012 14:28
  Last modified:	11 Nov 2024 16:16
  URI:	https://strathprints.strath.ac.uk/id/eprint/39244