Via hole addressed TFT and process for large-area a-Si:H electronics
Gleskova, Helena and Wagner, S. and Shen, D.; Wagner, S. and Hack, M. and Schiff, E. A. and Schropp, R. and Shimizu, I., eds. (1997) Via hole addressed TFT and process for large-area a-Si:H electronics. In: Amorphous and Microcrystalline Silicon Technology - 1997. MRS Symposium Proceedings, 467 . Materials Research Society, USA, pp. 869-874. ISBN 1558993711
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We demonstrate a new technology for RC gate delay reduction, by fabricating an array of amorphous silicon thin-film transistors (a-Si:H TFTs) on a thin glass substrate provided with via holes. AU gates are connected through via holes to a metal line that is run on the back side of the substrate. We opened via holes with a diameter of 35 to 50 mu m in 50 mu m glass foil. For the first time, all TFT pattern definition steps used a process which employs electrophotographic toner masks.
ORCID iDs
Gleskova, Helena
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Item type: Book Section ID code: 33503 Dates: DateEvent1997PublishedSubjects: Technology > Electrical engineering. Electronics Nuclear engineering Department: Faculty of Engineering > Electronic and Electrical Engineering Depositing user: Pure Administrator Date deposited: 27 Sep 2011 15:23 Last modified: 11 Nov 2024 14:45 URI: https://strathprints.strath.ac.uk/id/eprint/33503