An impact and risk assessment framework for national electronic identity (eID) systems

Edu, J. and Hooper, M. and Maple, C. and Crowcroft, J.; (2023) An impact and risk assessment framework for national electronic identity (eID) systems. In: International Conference on AI and the Digital Economy (CADE 2023). IET, ITA, pp. 124-133. ISBN 9781839539596 (https://doi.org/10.1049/icp.2023.2596)

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Abstract

Electronic identification (eID) systems allow citizens to assert and authenticate their identities for various purposes, such as accessing government services or conducting financial transactions. These systems improve user access to rights, services, and the formal economy. As eID systems become an essential facet of national development, any failure, compromise, or misuse can be costly and damaging to the government, users, and society. Therefore, an effective risk assessment is vital for identifying emerging risks to the system and assessing their impact. However, developing a comprehensive risk assessment for these systems must extend far beyond focusing on technical security and privacy impacts and must be conducted with a contextual understanding of stakeholders and the communities these systems serve. In this study, we posit that current risk assessments do not address risk factors for all key stakeholders and explore how potential compromise could impact them each in turn. In the examination of the broader impact of risks and the potentially significant consequences for stakeholders, we propose a framework that considers a wide range of factors, including the social, economic, and political contexts in which these systems were implemented. This provides a holistic platform for a better assessment of risk to the eID system.

ORCID iDs

Edu, J. ORCID logoORCID: https://orcid.org/0000-0003-1325-8740, Hooper, M., Maple, C. and Crowcroft, J.;
  • Item type:Book Section
    ID code:87394
    Dates:
    Date
    Event
    21 November 2023
    Published
    28 June 2023
    Published Online
    11 April 2023
    Accepted
    Notes:© 2023 IET. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
    Subjects:Science > Mathematics > Electronic computers. Computer science > Other topics, A-Z
    Department:Faculty of Science > Computer and Information Sciences
    Depositing user: Pure Administrator
    Date deposited:21 Nov 2023 11:48
    Last modified:11 Nov 2024 15:34
    URI:https://strathprints.strath.ac.uk/id/eprint/87394
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