Fault location in DC microgrids based on a multiple capacitive earthing scheme
Makkieh, Ahmad and Psaras, Vasileios and Pena Alzola, Rafael and Tzelepis, Dimitrios and Emhemed, Abdullah and Burt, Graeme (2020) Fault location in DC microgrids based on a multiple capacitive earthing scheme. IEEE Journal of Emerging and Selected Topics in Power Electronics. ISSN 2168-6777 (https://doi.org/10.1109/JESTPE.2020.2995946)
Preview |
Text.
Filename: Fault_Location_in_DC_Microgrids_based_on_a_Multiple_Capacitive_Earthing_Scheme.pdf
Accepted Author Manuscript Download (25MB)| Preview |
Abstract
This paper presents a new method for locating faults along feeders in a DC microgrid using a multiple capacitive earthing scheme. During fault conditions, capacitors within the earthing scheme are charging by transient currents that correlate to the fault distance and resistance. Therefore, by assessing the response of the capacitive earthing scheme during the fault, the distance to fault is estimated. The proposed method uti- lizes instantaneous current and voltage measurements (obtained from the feeder terminals and earthing capacitors) applied to an analytical mathematical model of the faulted feeder. The proposed method has been found to accurately estimate the fault position along the faulted feeder and systematic evaluation has been carried out to further scrutinize its performance under different loading scenarios and highly-resistive faults. Addition- ally, the performance and practical feasibility of the proposed method has been experimentally validated by developing a low- voltage laboratory prototype and testing it under a series of test conditions.
ORCID iDs
Makkieh, Ahmad, Psaras, Vasileios, Pena Alzola, Rafael, Tzelepis, Dimitrios ORCID: https://orcid.org/0000-0003-4263-7299, Emhemed, Abdullah and Burt, Graeme ORCID: https://orcid.org/0000-0002-0315-5919;-
-
Item type: Article ID code: 72591 Dates: DateEvent20 May 2020Published20 May 2020Published Online5 May 2020AcceptedNotes: © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Subjects: Technology > Electrical engineering. Electronics Nuclear engineering Department: Faculty of Engineering > Electronic and Electrical Engineering Depositing user: Pure Administrator Date deposited: 04 Jun 2020 15:54 Last modified: 11 Nov 2024 12:42 URI: https://strathprints.strath.ac.uk/id/eprint/72591