Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences

Paladino, Eleonora and Watson, David G. and Passarelli, Melissa K. and Lamprou, Dimitrios A. (2016) Time of flight secondary ion mass spectrometry (ToF-SIMS) in pharmaceutical sciences. In: 2016 UKICRS Workshop & Symposium, 2016-04-21 - 2016-04-22, Cardiff School of Pharmacy and Pharmaceutical Sciences. (Unpublished)

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Abstract

Structure-property relationships are often poorly defined in advanced continuous pharmaceutical manufacturing processes and products, and hence it is difficult to control the final product performance to the required degree to deliver advanced functionality. The dynamics of particles within complex mixtures and the effect of processes and storage on their disposition and microstructure is also challenging to measure. Hence, there is a clear need to have techniques for analysis and measurement of composition, dynamics and structure with increased spatial and temporal resolutions.

ORCID iDs

Paladino, Eleonora ORCID logoORCID: https://orcid.org/0000-0001-8324-4825, Watson, David G. ORCID logoORCID: https://orcid.org/0000-0003-1094-7604, Passarelli, Melissa K. and Lamprou, Dimitrios A. ORCID logoORCID: https://orcid.org/0000-0002-8740-1661;
CORE (COnnecting REpositories)