Diffraction grating characterisation for cold-atom experiments

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McGilligan, J. P. and Griffin, P. F. and Riis, E. and Arnold, A. S. (2016) Diffraction grating characterisation for cold-atom experiments. Journal of the Optical Society of America B, 33 (6). pp. 1271-1277. ISSN 1520-8540 (https://doi.org/10.1364/JOSAB.33.001271)

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Abstract

We have studied the optical properties of gratings micro-fabricated into semiconductor wafers, which can be used for simplifying cold-atom experiments. The study entailed characterisation of diffraction efficiency as a function of coating, periodicity, duty cycle and geometry using over 100 distinct gratings. The critical parameters of experimental use, such as diffraction angle and wavelength are also discussed, with an outlook to achieving optimal ultracold experimental conditions.

ORCID iDs

McGilligan, J. P. ORCID logoORCID: https://orcid.org/0000-0002-6514-9696, Griffin, P. F. ORCID logoORCID: https://orcid.org/0000-0002-0134-7554, Riis, E. ORCID logoORCID: https://orcid.org/0000-0002-3225-5302 and Arnold, A. S. ORCID logoORCID: https://orcid.org/0000-0001-7084-6958;
  • Item type:Article
    ID code:56599
    Dates:
    Date
    Event
    25 May 2016
    Published
    3 May 2016
    Published Online
    3 May 2016
    Accepted
    Notes:© 2016 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.
    Subjects:Science > Physics
    Department:Faculty of Science > Physics
    Depositing user: Pure Administrator
    Date deposited:03 Jun 2016 15:51
    Last modified:18 Dec 2024 01:19
    Related URLs:
    URI:https://strathprints.strath.ac.uk/id/eprint/56599
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