Long term testing and analysis of dielectric samples under DC excitation

Corr, Edward and Siew, W. H. and Zhao, Weijia; (2016) Long term testing and analysis of dielectric samples under DC excitation. In: IEEE Electrical Insulation Conference (2016). IEEE, CAN.

[thumbnail of Corr-etal-EIC2016-long-term-testing-analysis-dielectric-samples-under-DC-excitation]
Preview
 Text. Filename: Corr_etal_EIC2016_long_term_testing_analysis_dielectric_samples_under_DC_excitation.pdf
Accepted Author Manuscript
Download (612kB)| Preview

Abstract

This paper details testing conducted under DC conditions on a dielectric sample containing internal voids. The DC testing was conducted using a ramp method to vary the voltage applied to the dielectric sample. The dielectric sample was de-energised for a week prior to two separate identical ramp tests and the results are presented showing the variability of PD activity. After the second ramp test an additional ramp test was performed in quick succession and PD activity was reduced, emphasizing the importance of de-energising the sample between tests. A major challenge associated with void type dielectric samples is ensuring that repeatable results are generated and possible approaches are discussed.

ORCID iDs

Corr, Edward ORCID logoORCID: https://orcid.org/0000-0003-1980-4642, Siew, W. H. ORCID logoORCID: https://orcid.org/0000-0003-4000-6856 and Zhao, Weijia ORCID logoORCID: https://orcid.org/0000-0002-3055-7665;
CORE (COnnecting REpositories)