Temperature-dependent hysteresis of the emission spectrum of Eu-implanted, Mg-doped HVPE GaN
O'Donnell, K. P. and Martin, R. W. and Edwards, P. R. and Lorenz, K. and Alves, E. and Bockowski, M.; Ihn, Thomas and Rössler, Clemens and Kozikov, Aleksey, eds. (2013) Temperature-dependent hysteresis of the emission spectrum of Eu-implanted, Mg-doped HVPE GaN. In: The Physics of Semiconductors. AIP Conference Proceedings. ISBN 9780735411944
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A red emission site (hereafter, Eu0), with its main 5D0 to 7F2 peak at 619 nm, is observed by photoluminescence (PL) spectroscopy of Eu-implanted, Mg-doped GaN, in samples annealed at high temperature and pressure (up to 1400 °C, 1 GPa) in order to remove lattice damage. The PL spectrum is strongly temperature-hysteretic between room temperature and ∼20 K: below 30 K, photochromic switching occurs between Eu0 and the usually dominant Eu1 center; upon warming the sample, the Eu0 signal does not recover until the temperature reaches ∼150 K. Photobleaching of Eu1 takes place at low temperatures after cooling, while photo-enhancement of Eu0 takes place at high temperatures after re-warming. These observations suggest a microscopic model of charge-driven defect interconversion in p-type GaN:Eu, Mg.
Creators(s): |
O'Donnell, K. P. ![]() ![]() ![]() | Item type: | Book Section |
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ID code: | 46604 |
Keywords: | temperature dependent hysteresis, emission spectrum, eu-implanted, mg-doped, hvpe gan, Physics, Physics and Astronomy(all) |
Subjects: | Science > Physics |
Department: | Faculty of Science > Physics Technology and Innovation Centre > Bionanotechnology Technology and Innovation Centre > Photonics |
Depositing user: | Pure Administrator |
Date deposited: | 28 Jan 2014 11:54 |
Last modified: | 20 Jan 2021 15:33 |
URI: | https://strathprints.strath.ac.uk/id/eprint/46604 |
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