Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation

Ding, W. and Gorbach, A.V. and Wadsworth, W.J. and Knight, J.C. and Skryabin, D.V. and Strain, M.J. and Sorel, M. and De La Rue, R.M. (2011) Time- and frequency-domain measurements of solitons in subwavelength silicon waveguides using cross-correlation. In: 2011 Conference on Lasers and Electro-Optics Europe and 12th European Quantum Electronics Conference, CLEO EUROPE/EQEC 2011, 2011-05-22 - 2011-05-26.

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Abstract

Silicon photonics has attracted much attention [1]. While spectral measurements of nonlinear processes in subwavelength silicon-on-insulator (SOI) waveguides have been well reported, time-domain or simultaneous time-and-frequency characterization is required to fully characterize effects like soliton formation [2,3].