Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices

Niewczas, Pawel and Dziuda, Lukasz and Fusiek, Grzegorz and Willshire, Andrew James and McDonald, James and Thursby, Graham and Harvey, D. and Michie, Craig; (2002) Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices. In: IMTC 2002. IEEE instrumentation & measurement technology conference proceedings . IEEE, USA, pp. 1677-1681. ISBN 0780372182

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Abstract

In this paper we present details of a solid state interrogation system based on a 16-channel Arrayed Waveguide Grating (AWG) for interrogation of Extrinsic Fabry-Perot Interferometric (EFPI) sensors. The sensing element is configured In a reflecting mode and is illuminated by a broad-band light source through art optical fiber. The spectrum of fight reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient it(formation for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation.

ORCID iDs

Niewczas, Pawel ORCID logoORCID: https://orcid.org/0000-0003-3291-1725, Dziuda, Lukasz, Fusiek, Grzegorz ORCID logoORCID: https://orcid.org/0000-0002-3361-7803, Willshire, Andrew James, McDonald, James ORCID logoORCID: https://orcid.org/0000-0002-7078-845X, Thursby, Graham, Harvey, D. and Michie, Craig;
  • Item type:Book Section
    ID code:40183
    Dates:
    Date
    Event
    2002
    Published
    Keywords:interrogation, extrinsic, Fabry-Perot, interferometric sensors, arrayed waveguide grating devices , arrayed waveguide gratings, strain measurement , solid state circuits , sensor systems , sensor arrays , optical waveguides , optical interferometry , optical fibers , light sources , Electrical engineering. Electronics Nuclear engineering
    Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
    Department:Faculty of Engineering > Electronic and Electrical Engineering
    Depositing user: Pure Administrator
    Date deposited:22 Jun 2012 13:46
    Last modified:20 Jan 2021 15:26
    URI:https://strathprints.strath.ac.uk/id/eprint/40183
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