Testing analogue circuits with binary sequences : a feasibility study

Bekheit, M. and Hamilton, D.J. and Stimpson, B.P. (2002) Testing analogue circuits with binary sequences : a feasibility study. In: 8th IEEE International Mixed Signal Testing Workshop, 2002-01-01.

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Abstract

This paper provides a feasibility study of testing analogue circuits with binary sequences

ORCID iDs

Bekheit, M., Hamilton, D.J. and Stimpson, B.P. ORCID logoORCID: https://orcid.org/0000-0003-2559-9489;