Testing analogue circuits with binary sequences : a feasibility study

Bekheit, M. and Hamilton, D.J. and Stimpson, B.P. (2002) Testing analogue circuits with binary sequences : a feasibility study. In: 8th IEEE International Mixed Signal Testing Workshop, 2002-01-01.

Abstract

This paper provides a feasibility study of testing analogue circuits with binary sequences

ORCID iDs

Stimpson, B.P. ORCID: https://orcid.org/0000-0003-2559-9489

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• Item metadata

  Item type:	Conference or Workshop Item(Paper)
  ID code:	38896
  Dates:	Date Event 2002 Published
  Subjects:	Technology > Electrical engineering. Electronics Nuclear engineering
  Department:	Faculty of Engineering > Electronic and Electrical Engineering
  Depositing user:	Pure Administrator
  Date deposited:	03 Apr 2012 13:28
  Last modified:	11 Nov 2024 16:15
  URI:	https://strathprints.strath.ac.uk/id/eprint/38896