Microscopic characterisation of luminescent III-N:RE epilayers

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Martin, Robert; O'Donnell, Kevin Peter and Dierolf, Volkmar, eds. (2010) Microscopic characterisation of luminescent III-N:RE epilayers. In: Rare Earth Doped III-Nitrides For Optoelectronic And Spintronic Applications. Topics in Applied Physics . Springer-Verlag Berlin, Berlin, pp. 189-219. ISBN 978-90-481-2876-1

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Abstract

Study of the luminescence of Rare Earth ions introduced into III-nitride semiconductor hosts produces a wealth of important information. This chapter describes investigations of photoluminescence and cathodoluminescence spectroscopy on a range of RE-implanted samples, with hosts including GaN, AlGaN and AlInN. Raising the post-implantation annealing temperature is shown to lead to a dramatic increase in RE luminescence intensity, and methods to allow annealing well above the growth temperature of the host are discussed. The high-brightness samples that result enable the resolution of additional fine-structure in the luminescence from GaN:Eu and clarification of multiple sites for the RE. Measurements for AlGaN hosts covering the entire composition range point to the importance of core-excitons in the luminescence process. Adding in information from X-ray microanalysis and high spatial resolution luminescence mapping reveals further details of the effects resulting from annealing and of changes in host composition.

ORCID iDs

Martin, Robert ORCID logoORCID: https://orcid.org/0000-0002-6119-764X; O'Donnell, Kevin Peter and Dierolf, Volkmar
  • Item type:Book Section
    ID code:35400
    Dates:
    Date
    Event
    2010
    Published
    Subjects:Science > Physics
    Department:Faculty of Science > Physics
    Depositing user: Pure Administrator
    Date deposited:04 Nov 2011 13:28
    Last modified:11 Nov 2024 14:46
    Related URLs:
    URI:https://strathprints.strath.ac.uk/id/eprint/35400
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