Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films
Trager-Cowan, Carol and Gunasekar, Naresh and Hourahine, Benjamin and Edwards, Paul and Bruckbauer, Jochen and Martin, Robert and Mauder, Christof and Day, Austin and England, Gordon and Winkelmann, Aimo and Parbrook, Peter and Wilkinson, Anjus (2012) Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films. Microscopy and Microanalysis, 18 (S2). pp. 684-685. ISSN 1431-9276 (https://doi.org/10.1017/S1431927612005272)
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We are now all familiar with the bright blue, green and white LEDs that light up our electronic appliances; decorate our streets and buildings and illuminate airport runways. However, the ultimate performance of these nitride semiconductor based LEDs is limited by extended defects such as threading dislocations (TDs), partial dislocations (PDs) and stacking faults (SFs). If we want to develop LEDs to be an effective replacement for the light bulb, or have sufficient power to purify water; we need to eliminate these defects as they act as scattering centres for light and charge carriers and give rise to nonradiative recombination and to leakage currents, severely limiting device performance. The capability to rapidly detect and analyze TDs, PDs and SFs, with negligible sample preparation, represents a real step forward in the development of more efficient nitride-based semiconductor devices
ORCID iDs
Trager-Cowan, Carol ORCID: https://orcid.org/0000-0001-8684-7410, Gunasekar, Naresh ORCID: https://orcid.org/0000-0002-9642-8137, Hourahine, Benjamin ORCID: https://orcid.org/0000-0002-7667-7101, Edwards, Paul ORCID: https://orcid.org/0000-0001-7671-7698, Bruckbauer, Jochen ORCID: https://orcid.org/0000-0001-9236-9320, Martin, Robert ORCID: https://orcid.org/0000-0002-6119-764X, Mauder, Christof, Day, Austin, England, Gordon, Winkelmann, Aimo, Parbrook, Peter and Wilkinson, Anjus;-
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Item type: Article ID code: 44510 Dates: DateEvent2012PublishedNotes: Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. Subjects: Science > Microbiology
Science > PhysicsDepartment: Faculty of Science > Physics
Technology and Innovation Centre > Photonics
Technology and Innovation Centre > BionanotechnologyDepositing user: Pure Administrator Date deposited: 21 Aug 2013 10:47 Last modified: 11 Nov 2024 10:27 URI: https://strathprints.strath.ac.uk/id/eprint/44510