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Blair, E. O. and Basanta, L. Parga and Schmueser, I. and Marland, J. R. K. and Buchoux, A. and Tsiamis, A. and Dunare, C. and Normand, M. and Stokes, A. A. and Walton, A. J. and Smith, S.; (2018) Wafer level characterisation of microelectrodes for electrochemical sensing applications. In: 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS). Institute of Electrical and Electronics Engineers Inc., USA, pp. 179-184. ISBN 9781538650691