On a new point process approach to reliability improvement modeling for repairable systems

Finkelstein, Maxim and Cha, Ji Hwan (2024) On a new point process approach to reliability improvement modeling for repairable systems. Applied Stochastic Models in Business and Industry. ISSN 1524-1904 (https://doi.org/10.1002/asmb.2906)

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Abstract

In this paper, we are the first to consider the combination of the minimal repair with the defined better than minimal repair. With a given probability, each failure of a repairable system is minimally repaired and with complementary probability it is better than minimally repaired. The latter can be interpreted in terms of a reliability growth model when a defect of a system is eliminated on each failure. It turns out that the better than minimal repair can be even better than a perfect one if a perfect repair is understood as a replacement of the whole system or stochastically equivalent operation. We provide stochastic description of the failure/repair process by introducing and describing the corresponding bivariate point process via the concept of stochastic intensity. Distributions for the number of failures for the pooled and marginal processes are derived along with their expected values. The latter can describe the process of reliability growth in applications. Some meaningful special cases are discussed.

ORCID iDs

Finkelstein, Maxim ORCID logoORCID: https://orcid.org/0000-0002-3018-8353 and Cha, Ji Hwan;
CORE (COnnecting REpositories)