Atomic force microscopy of inGaN-based structures grown by metal-organic chemical vapour deposition

Liu, C. and Deatcher, C.J. and Cheong, M.G. and Watson, I.M. (2003) Atomic force microscopy of inGaN-based structures grown by metal-organic chemical vapour deposition. Institute of Physics Conference Series, 180. pp. 657-660. ISSN 0951-3248

Full text not available in this repository.Request a copy

Abstract

Paper discussing atomic force microscopy of inGaN-based structures grown by metal-organic chemical vapour deposition.