Comparing generation III relaxor-PT single crystal with modified PZT-4 for power ultrasonics devices
Chibli, Abdul Hadi and Lucas, Margaret and Gachagan, Anthony and Cochran, Sandy; (2023) Comparing generation III relaxor-PT single crystal with modified PZT-4 for power ultrasonics devices. In: 2023 IEEE International Symposium on Applications of Ferroelectrics (ISAF). IEEE International Symposium on Applications of Ferroelectrics (ISAF) . IEEE, USA. ISBN 9781665463232 (https://doi.org/10.1109/isaf53668.2023.10265571)
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Abstract
Lead-based piezocrystals have been thoroughly investigated by various research teams for power ultrasonic transducers. The key objective of this work is to evaluate whether Gen. III single crystal could provide similar performance to the Navy type I (similar properties to PZT-4) and help in miniaturising the overall length of power ultrasonic instruments. This study started by incorporating four different material rings, Pz24, Pz26, and PIC181, as modified PZT-4, and Mn: PIN-PMN-PT (Gen. III single crystal) in cylindrical bolted Langevin transducers (BLTs) and comparing their key performance with respect to mechanical quality factor, electromechanical coupling coefficient, non-linearity, vibration response and nodal plane location. For the same operating frequency for all BLTs, the Gen. III single crystal transducer was found to be the shortest in length by 8~11 mm (7.6 ~ 10.4%). When testing the vibrational amplitude, the Gen. III single crystal has the highest tip normal-to-surface amplitude with lower current compared to other transducers. Gen. III was found to not follow the same non-linear behaviours as the piezoceramics transducer. Thus, the Gen. III transducer undergoes a change of material properties and depolarisation when excited with high voltage.
ORCID iDs
Chibli, Abdul Hadi, Lucas, Margaret, Gachagan, Anthony ORCID: https://orcid.org/0000-0002-9728-4120 and Cochran, Sandy;-
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Item type: Book Section ID code: 88763 Dates: DateEvent29 September 2023Published24 February 2023AcceptedSubjects: Technology > Electrical engineering. Electronics Nuclear engineering Department: Faculty of Engineering > Electronic and Electrical Engineering Depositing user: Pure Administrator Date deposited: 17 Apr 2024 13:26 Last modified: 11 Nov 2024 15:34 URI: https://strathprints.strath.ac.uk/id/eprint/88763