XLPE cable insulation resistance modelling under annealing and thermal ageing effects

Ge, Xufei and Fan, Fulin and Given, Martin J. and Stewart, Brian G. (2023) XLPE cable insulation resistance modelling under annealing and thermal ageing effects. In: 98th IEEE Conference on Electrical Insulation and Dielectric Phenomena, 2023-10-15 - 2023-10-19, 2 Meadowlands Plaza.

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Abstract

Cross-linked polyethylene (XLPE) insulated electrical cables are widely deployed for electricity transmission due to the reliable thermomechanical performance and excellent electrical dielectric properties of XLPE insulation. Insulation resistance (IR) is a common metric indicating the electrical condition of cable insulation that undergoes annealing and thermal ageing over its service life. Most research related to the IR simulation deals with either the thermal ageing process of XLPE insulation itself or the annealing process of XLPE insulation by considering the diffusion of chemical specifies from semicon layers. This paper develops a discretisation IR model to estimate the temperature distribution across the XLPE insulation layer and simulate the IR drop under the thermal ageing effect or the U-shape variation of IR under the joint effects of annealing and thermal ageing, respectively. The IR simulation results are discussed around the necessity of combining annealing and thermal ageing effects for IR simulation with the presence of semicon layers.

  • Item type:Conference or Workshop Item(Paper)
    ID code:86146
    Dates:
    Date
    Event
    19 October 2023
    Published
    4 July 2023
    Accepted
    Notes:© 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
    Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
    Department:Faculty of Engineering > Electronic and Electrical Engineering
    Depositing user: Pure Administrator
    Date deposited:13 Jul 2023 12:55
    Last modified:27 Apr 2024 13:09
    URI:https://strathprints.strath.ac.uk/id/eprint/86146
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