ToF-SIMS : methods & applications
Tools
Prakash, Aruna and Chrubasik, Michael and McGlone, Thomas and Johnston, Blair (2022) ToF-SIMS : methods & applications. In: CMAC Annual Open Day 2022, 2022-05-16 - 2022-05-18.
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Abstract
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful tool for investigating the elemental and molecular variation across surfaces and through sub-surface layers.
ORCID iDs
Prakash, Aruna ORCID: https://orcid.org/0000-0001-7368-3875, Chrubasik, Michael ORCID: https://orcid.org/0000-0002-3357-6730, McGlone, Thomas ORCID: https://orcid.org/0000-0002-9897-1790 and Johnston, Blair ORCID: https://orcid.org/0000-0001-9785-6822;Persistent Identifier
https://doi.org/10.17868/strath.00081903-
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Item type: Conference or Workshop Item(Poster) ID code: 81903 Dates: DateEvent16 May 2022PublishedSubjects: Medicine > Therapeutics. Pharmacology Department: Faculty of Science > Strathclyde Institute of Pharmacy and Biomedical Sciences Depositing user: Pure Administrator Date deposited: 17 Aug 2022 12:51 Last modified: 11 Nov 2024 17:06 URI: https://strathprints.strath.ac.uk/id/eprint/81903
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