ToF-SIMS : methods & applications

Prakash, Aruna and Chrubasik, Michael and McGlone, Thomas and Johnston, Blair (2022) ToF-SIMS : methods & applications. In: CMAC Annual Open Day 2022, 2022-05-16 - 2022-05-18.

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Abstract

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful tool for investigating the elemental and molecular variation across surfaces and through sub-surface layers.

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  Item type:	Conference or Workshop Item(Poster)
  ID code:	81903
  Dates:	Date Event 16 May 2022 Published
  Subjects:	Medicine > Therapeutics. Pharmacology
  Department:	Faculty of Science > Strathclyde Institute of Pharmacy and Biomedical Sciences
  Depositing user:	Pure Administrator
  Date deposited:	17 Aug 2022 12:51
  Last modified:	09 Apr 2024 06:58
  URI:	https://strathprints.strath.ac.uk/id/eprint/81903