A structured illumination microscopy module using two micro-electromechanical system scanning micromirrors

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Tinning, Peter W. and Donnachie, Mark and Christopher, Jay L. and Uttamchandani, Deepak and Bauer, Ralf (2022) A structured illumination microscopy module using two micro-electromechanical system scanning micromirrors. Proceedings of SPIE, 11967. 1196706. ISSN 0277-786X (https://doi.org/10.1117/12.2608564)

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Abstract

We present the development and application of a novel structured illumination microscope (SIM) in which the grating pattern is generated using two optical beams controlled via two micro-electro-mechanical system (MEMS) 3D scanning micromirrors, each having static angular and piston control. This arrangement enables the generation of a fully controllable spatial interference pattern at the focal plane by adjusting the positions of the beams in the back-aperture of a high numerical aperture (NA) microscope objective. The utilization of MEMS micromirrors to control angular, radial and phase positioning for the structured illumination patterns has advantages of flexible control of the fluorescence excitation illumination, with achromatic beam delivery through the same optical path, reduced spatial footprint and cost-efficient integration.

ORCID iDs

Tinning, Peter W. ORCID logoORCID: https://orcid.org/0000-0002-3270-4120, Donnachie, Mark ORCID logoORCID: https://orcid.org/0000-0001-5391-236X, Christopher, Jay L. ORCID logoORCID: https://orcid.org/0009-0009-0707-8947, Uttamchandani, Deepak ORCID logoORCID: https://orcid.org/0000-0002-2362-4874 and Bauer, Ralf ORCID logoORCID: https://orcid.org/0000-0001-7927-9435;
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