Multi-sample differential protection scheme in DC microgrids

Li, Chunpeng and Rakhra, Puran and Norman, Patrick and Burt, Graeme and Clarkson, Paul (2020) Multi-sample differential protection scheme in DC microgrids. IEEE Journal of Emerging and Selected Topics in Power Electronics. ISSN 2168-6777 (https://doi.org/10.1109/JESTPE.2020.3005588)

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Abstract

This paper proposes a novel solution to the issue of protection instability caused by time synchronization error in high-speed differential protection schemes for DC microgrids. DC microgrids provide a more efficient platform to integrate fast-growing renewable energy sources, energy storage systems, and electronic loads. However, the integration of distributed generators (DG) may result in variable fault current magnitude and direction during fault conditions, potentially causing mis-coordination of conventional time graded overcurrent relays. One identified solution to this issue utilizes high-speed differential protection schemes to maintain effective selectivity in DG-dominated DC microgrids. However, as DC short-circuit fault currents are highly transient, microseconds of synchronization error in the measured line currents may cause protection stability issues, whereby mal-operation of relays may occur as a result of faults external to the protected zone. This paper investigates the impact of time synchronization errors for high-speed differential protection in DC distribution systems. It then proposes a multi-sample differential (MSD) scheme that performs multiple differential comparisons over a sampling window to ensure the stability of high-speed differential protection schemes for external faults whilst maintaining sensitivity to internal faults.

ORCID iDs

Li, Chunpeng ORCID logoORCID: https://orcid.org/0000-0003-3650-0480, Rakhra, Puran, Norman, Patrick ORCID logoORCID: https://orcid.org/0000-0001-5577-1281, Burt, Graeme ORCID logoORCID: https://orcid.org/0000-0002-0315-5919 and Clarkson, Paul;
  • Item type:Article
    ID code:73946
    Dates:
    Date
    Event
    29 June 2020
    Published
    21 June 2020
    Accepted
    Notes:© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting /republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
    Keywords:circuit faults, synchronization, microgrids, power electronics, Electrical Engineering. Electronics Nuclear Engineering, Electrical and Electronic Engineering
    Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
    Department:Faculty of Engineering > Electronic and Electrical Engineering
    Strategic Research Themes > Ocean, Air and Space
    Depositing user: Pure Administrator
    Date deposited:22 Sep 2020 14:29
    Last modified:29 Nov 2023 05:29
    URI:https://strathprints.strath.ac.uk/id/eprint/73946
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