Measuring smoothness of trigonometric interpolation through incomplete sample points
Weiss, Stephan and Selva, Jesus and Macleod, Malcolm D.; (2020) Measuring smoothness of trigonometric interpolation through incomplete sample points. In: 2020 28th European Signal Processing Conference (EUSIPCO). IEEE, NLD. ISBN 9789082797053 (https://doi.org/10.23919/Eusipco47968.2020.9287694)
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Abstract
In this paper we present a metric to assess the smoothness of a trigonometric interpolation through an incomplete set of sample points. We measure smoothness as the power of a particular derivative of a 2π-periodic Dirichlet interpolant through some sample points. We show that we do not need to explicitly complete the sample set or perform the interpolation, but can simply work with the available sample points, under the assumption that any missing points are chosen to minimise the metric, and present a simple and robust approach to the computation of this metric. We assess the accuracy and computational complexity of this approach, and compare it to benchmarks.
ORCID iDs
Weiss, Stephan ORCID: https://orcid.org/0000-0002-3486-7206, Selva, Jesus and Macleod, Malcolm D.;-
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Item type: Book Section ID code: 72583 Dates: DateEvent18 December 2020Published29 April 2020AcceptedNotes: © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Subjects: Technology > Electrical engineering. Electronics Nuclear engineering Department: Faculty of Engineering > Electronic and Electrical Engineering Depositing user: Pure Administrator Date deposited: 04 Jun 2020 14:35 Last modified: 13 Nov 2024 20:40 Related URLs: URI: https://strathprints.strath.ac.uk/id/eprint/72583