Study of a 0.35 THz extended interaction oscillator driven by a pseudospark-sourced sheet electron beam

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Xie, Jie and Zhang, Liang and Yin, Huabi and He, Wenlong and Ronald, Kevin and Phelps, A. D. R. and Chen, Xiaodong and Zhang, Jin and Alfadhl, Yasir and Yuan, Xuesong and Meng, Lin and Cross, Adrian W. (2020) Study of a 0.35 THz extended interaction oscillator driven by a pseudospark-sourced sheet electron beam. IEEE Transactions on Electron Devices, 67 (2). pp. 652-658. ISSN 0018-9383 (https://doi.org/10.1109/TED.2019.2957760)

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Abstract

A compact high-power extended interaction oscillator (EIO) driven by a pseudospark-sourced (PS-sourced) sheet electron beam (SEB) is presented at 0.35 THz. It combines the advantages of a planar interaction circuit and a SEB generated from the PS discharge, including a large beam cross-section, high gain per unit length, and high current density with the additional benefit of not requiring an external focusing magnetic field. Staying within what is achievable with microfabrication techniques, the influence of tolerance on the Q value, resonance frequency, and characteristic impedance was investigated. The effect of surface roughness caused by the manufacturing method on Ohmic loss of the material surface was studied. The advanced microfabrication techniques of Ultra Violet Lithographie, Galvanik, and Abformung (UV-LIGA) and Nano-computer numerical control (Nano-CNC), which are capable of realizing high precision and a metal surface of sufficient smoothness, were proposed to manufacture the planar structures. The effect of plasma density in PS-sourced SEB on the resonance frequency of the EIO circuit was investigated. The simulation results showed that the output signal had a slight frequency upshift and a decrease of the output power as the plasma density increased at 0.35 THz, which is consistent with the theoretical analysis. Beam-wave interaction simulations for this planar EIO predicted a peak output power of 1.8 kW at 0.35 THz using an effective value of conductivity of 1.1 × 10 7 S/m to take into account the skin depth and surface roughness.

ORCID iDs

Xie, Jie, Zhang, Liang ORCID logoORCID: https://orcid.org/0000-0002-6317-0395, Yin, Huabi ORCID logoORCID: https://orcid.org/0000-0002-6635-9759, He, Wenlong, Ronald, Kevin ORCID logoORCID: https://orcid.org/0000-0002-8585-0746, Phelps, A. D. R. ORCID logoORCID: https://orcid.org/0000-0002-1100-1012, Chen, Xiaodong, Zhang, Jin, Alfadhl, Yasir, Yuan, Xuesong, Meng, Lin and Cross, Adrian W. ORCID logoORCID: https://orcid.org/0000-0001-7672-1283;
  • Item type:Article
    ID code:70657
    Dates:
    Date
    Event
    29 February 2020
    Published
    31 December 2019
    Published Online
    28 November 2019
    Accepted
    Notes:© © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
    Subjects:Science > Physics
    Department:Faculty of Science > Physics
    Depositing user: Pure Administrator
    Date deposited:28 Nov 2019 11:53
    Last modified:12 Dec 2024 09:00
    URI:https://strathprints.strath.ac.uk/id/eprint/70657
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