Extended X-ray absorption fine structure study of Er bonding in AlNO:Erx films with x <= 3.6%

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Katsikini, M. and Katchkanov, V. and Boulet, P. and Edwards, P. R. and O'Donnell, K. P. and Brien, V. (2018) Extended X-ray absorption fine structure study of Er bonding in AlNO:Erx films with x <= 3.6%. Journal of Applied Physics, 124 (8). 085705. ISSN 0021-8979 (https://doi.org/10.1063/1.5036614)

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Abstract

The structural properties of Er-doped AlNO epilayers grown by radio frequency magnetron sputtering were studied by Extended X-ray Absorption Fine Structure (EXAFS) spectra recorded at the Er L3 edge. The analysis revealed that Er substitutes for Al in all the studied samples and the increase in Er concentration from 0.5 to 3.6 at.% is not accompanied by formation of ErN, Er2O3 or Er clusters. Simultaneously recorded X-ray Absorption Near Edge Structure (XANES) spectra verify that the bonding configuration of Er is similar in all studied samples. The Er-N distance is constant at 2.18-2.19 Å i.e. approximately 15% larger than the Al-N bondlength, revealing that the introduction of Er in the cation sublattice causes considerable local distortion. The Debye-Waller factor, which measures the static disorder, of the second nearest shell of Al neighbors, has a local minimum for the sample containing 1% Er that coincides with the highest photoluminescence efficiency of the sample set.

ORCID iDs

Katsikini, M., Katchkanov, V., Boulet, P., Edwards, P. R. ORCID logoORCID: https://orcid.org/0000-0001-7671-7698, O'Donnell, K. P. ORCID logoORCID: https://orcid.org/0000-0003-3072-3675 and Brien, V.;
  • Item type:Article
    ID code:64845
    Dates:
    Date
    Event
    28 August 2018
    Published
    21 July 2018
    Accepted
    17 April 2018
    Submitted
    Subjects:Science > Physics
    Department:Faculty of Science > Physics
    Depositing user: Pure Administrator
    Date deposited:24 Jul 2018 09:47
    Last modified:12 Dec 2024 06:56
    Related URLs:
    URI:https://strathprints.strath.ac.uk/id/eprint/64845
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