Detección de delaminaciones y otros defectos de unión en productos de acero multicapa Al/Al-Sn/Al llevando a cabo la monitorización con ondas guiadas EMAT

Tallafuss, Philipp J. and Garcia, V. and Kowski, P. and Romero, A. (2017) Detección de delaminaciones y otros defectos de unión en productos de acero multicapa Al/Al-Sn/Al llevando a cabo la monitorización con ondas guiadas EMAT. AEND - Asociación Española de Ensayos No Destructivos, 3 (80). pp. 30-38. 2. ISSN 1888-9166

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Abstract

Rayleigh-Lamb, ultrasonic, guided wave modes were used to detect delamination, embedded steel debris and a brittle intermetallic Al-Fe diffusion bond layer at the interface between clad Al and steel, which were bonded together in a cold roll bonding (CRB) process. Multi-layered samples were produced, with artificially implanted defects of different sizes between the clad Al and steel layer to determine the sensitivity of the guided wave modes to qualitatively indicate the occurrence of defects based on signal attenuation caused by defects. Electromagnetic acoustic transducers (EMATs) were used to generate and detect the guided waves in the pitch and catch technique. Signals were measured in the as rolled and post rolling annealed state to determine the influence of the altered material properties on attenuation and Signal-to-Noise Ratio (SNR). Results show very good sensitivity of the S0 wave mode for delamination and embedded steel debris detection and a relation between attenuation, defect type, size and annealing state. However, detection of the presence of a brittle intermetallic Al-Fe diffusion layer was not possible due to the strong sensitivity to the material properties and thicknesses of the clad Al and steel materials. Micro sections of all samples were examined to explain the observations. The results suggest a promising use of Rayleigh-Lamb guided wave modes for online detection of bond defects in serial production of Al-Sn alloy/steel bimetal strips.

ORCID iDs

Tallafuss, Philipp J. ORCID logoORCID: https://orcid.org/0000-0002-7821-7985, Garcia, V., Kowski, P. and Romero, A.;
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