MV cable lifetime improvement analysis through transformer tap changes

Sheng, Bojie and Peer Mohamed, Faisal and Siew, Wah Hoon and Stewart, Brian G; (2018) MV cable lifetime improvement analysis through transformer tap changes. In: 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomena. IEEE Dielectrics and and Electrical Insulation Society, Piscataway, N.J., pp. 177-180. ISBN 978-1-5386-1194-4 (https://doi.org/10.1109/CEIDP.2017.8257548)

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Abstract

Cable life depends mainly on the thermal stress, which relates to the current applied on the cable. Voltage changes in medium voltage (MV) cables due to transformer tap changes will also change the current flowing through the cable, which will change the cable temperature. In order to extend the cable life, this paper aims to simulate and analyse the potential thermal lifetime improvement of cables through long-term tap changes within the statutory levels. Firstly, the IEC standard (60287) method for rating and modelling cables is applied to evaluate the cable temperature under different voltages and relative currents. Different cable configurations will also be considered in simulations as temperature is dependent on the cable dimensions. Then, typical thermal lifetime analytical expressions will be used to evaluate the long-term influence of voltage changes. Lastly, the obtained thermal lifetime assessments under different transformer tap changes and different cable configurations will provide a potential understanding of cable lifetime changes through implementation of permitted regulatory voltage changes.

  • Item type:Book Section
    ID code:62271
    Dates:
    Date
    Event
    15 January 2018
    Published
    10 October 2017
    Accepted
    Notes:© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting /republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
    Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
    Department:Faculty of Engineering > Electronic and Electrical Engineering
    Depositing user: Pure Administrator
    Date deposited:07 Nov 2017 15:32
    Last modified:18 Apr 2024 00:06
    Related URLs:
    URI:https://strathprints.strath.ac.uk/id/eprint/62271
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