Cross sectional TEM analysis of duplex HIPIMS and DC magnetron sputtered Mo and W doped carbon coatings

Tools

Sharp, J and Castillo Muller, I and Mandal, P and Abbas, A and West, G and Rainforth, W M and Ehiasarian, A and Hovsepian, P (2015) Cross sectional TEM analysis of duplex HIPIMS and DC magnetron sputtered Mo and W doped carbon coatings. Journal of Physics: Conference Series, 644. 012011. ISSN 1742-6596 (https://doi.org/10.1088/1742-6596/644/1/012011)

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Abstract

A FIB lift-out sample was made from a wear-resistant carbon coating deposited by high power impulse magnetron sputtering (HIPIMS) with Mo and W. TEM analysis found columnar grains extending the whole ∼1800 nm thick film. Within the grains, the carbon was found to be organised into clusters showing some onion-like structure, with amorphous material between them; energy dispersive X-ray spectroscopy (EDS) found these clusters to be Mo- and W-rich in a later, thinner sample of the same material. Electron energy-loss spectroscopy (EELS) showed no difference in C-K edge, implying the bonding type to be the same in cluster and matrix. These clusters were arranged into stripes parallel to the film plane, of spacing 7-8 nm; there was a modulation in spacing between clusters within these stripes that produced a second, coarser set of striations of spacing ∼37 nm.

ORCID iDs

Sharp, J, Castillo Muller, I, Mandal, P ORCID logoORCID: https://orcid.org/0000-0002-8440-703X, Abbas, A, West, G, Rainforth, W M, Ehiasarian, A and Hovsepian, P;
CORE (COnnecting REpositories)