Atomic force microscopy of InGaN-based structures grown by metal-organic vapour phase epitaxy

Liu, C. and Deatcher, C.J. and Cheong, M.G. and Watson, I.M. (2003) Atomic force microscopy of InGaN-based structures grown by metal-organic vapour phase epitaxy. Institute of Physics Conference Series, 180. pp. 657-660. ISSN 0951-3248

ORCID iDs

Watson, I.M. ORCID: https://orcid.org/0000-0002-8797-3993

• Share and Export
  

  MPEG-21 DIDLASCII CitationHTML CitationRefWorksMETSSimple MetadataRDF+XMLMultiline CSVEndNoteEP3 XMLBibTeXRDF+N3AtomData Cite XMLMODSJSONOpenURL ContextObject in SpanRDF+N-TriplesDublin CoreReferOpenURL ContextObjectRIOXX2 XMLRIS (EndNote Online, Zotero, Ref manager, etc)
• Item metadata

  Item type:	Article
  ID code:	5246
  Dates:	Date Event 2003 Published
  Notes:	Proceedings of the 13th Conference on Microscopy of Semiconducting Materials, Cambridge, 2003
  Subjects:	Science > Physics > Optics. Light
  Department:	Faculty of Science > Physics > Institute of Photonics Faculty of Science > Physics
  Depositing user:	Strathprints Administrator
  Date deposited:	29 Jan 2008
  Last modified:	11 Nov 2024 08:40
  URI:	https://strathprints.strath.ac.uk/id/eprint/5246