Integrated microspectrometer with elliptical Bragg mirror enhanced diffraction grating on silicon on insulator

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Pottier, Pierre and Strain, Michael J. and Packirisamy, Muthukumaran (2014) Integrated microspectrometer with elliptical Bragg mirror enhanced diffraction grating on silicon on insulator. ACS Photonics, 1 (5). 430–436. ISSN 2330-4022 (https://doi.org/10.1021/ph400165j)

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Abstract

An on-chip micro-spectrometer is demonstrated based on a circular diffraction grating consisting of an elliptical Bragg mirror. This structure results in a highly efficient and compact device with simplified processing requirements, useful for sensing, spectroscopy, telecom demultiplexing, and optical interconnects. The computed efficiency for a realistic geometry is 0.14 dB, which represents to the best of our knowledge the highest predicted efficiency for concave diffraction gratings (echelle/echelette gratings). The first realization of the elliptical Bragg mirror diffraction grating spectrometer is presented on silicon on insulator at a wavelength of 1.55 µm. Measurements show a full device efficiency of 3.0 dB, including all in-line losses, with a band flatness of 0.4 dB over 30 nm.

ORCID iDs

Pottier, Pierre, Strain, Michael J. ORCID logoORCID: https://orcid.org/0000-0002-9752-3144 and Packirisamy, Muthukumaran;
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