Integrated microspectrometer with elliptical Bragg mirror enhanced diffraction grating on silicon on insulator

Pottier, Pierre and Strain, Michael J. and Packirisamy, Muthukumaran (2014) Integrated microspectrometer with elliptical Bragg mirror enhanced diffraction grating on silicon on insulator. ACS Photonics, 1 (5). 430–436. ISSN 2330-4022 (https://doi.org/10.1021/ph400165j)

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Abstract

An on-chip micro-spectrometer is demonstrated based on a circular diffraction grating consisting of an elliptical Bragg mirror. This structure results in a highly efficient and compact device with simplified processing requirements, useful for sensing, spectroscopy, telecom demultiplexing, and optical interconnects. The computed efficiency for a realistic geometry is 0.14 dB, which represents to the best of our knowledge the highest predicted efficiency for concave diffraction gratings (echelle/echelette gratings). The first realization of the elliptical Bragg mirror diffraction grating spectrometer is presented on silicon on insulator at a wavelength of 1.55 µm. Measurements show a full device efficiency of 3.0 dB, including all in-line losses, with a band flatness of 0.4 dB over 30 nm.

ORCID iDs

Pottier, Pierre, Strain, Michael J. ORCID logoORCID: https://orcid.org/0000-0002-9752-3144 and Packirisamy, Muthukumaran;
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