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In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip

Annoni, A. and Melloni, A. and Strain, M. J. and Sorel, M. and Morichetti, F. (2014) In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip. In: 2014 16th International Conference on Transparent Optical Networks (ICTON). IEEE, Piscataway, New Jersey. ISBN 9781479956005

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Abstract

A high sensitivity in-band OSNR monitor system integrated on SOI platform is presented. The device exploits a narrow-band microring resonator to select the portion of the channel spectrum that is most sensitive to OSNR variations, and performs an autocorrelation measurement using a Mach-Zehnder interferometer. The proposed scheme allows in-line OSNR monitoring from 8 dB to 28 dB, with 0.2 dB accuracy.

Author(s):Annoni, A., Melloni, A., Strain, M. J., Sorel, M. and Morichetti, F.
Item type:Book Section
ID code:49303
Keywords:delay-line interferometer, in-band optical signal-to-noise ratio (OSNR), integrated optics devices, optical performance monitoring, silicon photonics, Electrical engineering. Electronics Nuclear engineering, Optics. Light, Computer Networks and Communications, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials
Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
Science > Physics > Optics. Light
Department:Faculty of Science > Physics > Institute of Photonics
University of Strathclyde > University of Strathclyde
Depositing user: Pure Administrator
Date deposited:18 Sep 2014 16:01
Last modified:04 Jan 2019 03:19
Related URLs:
URI:https://strathprints.strath.ac.uk/id/eprint/49303
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