In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip

Annoni, A. and Melloni, A. and Strain, M. J. and Sorel, M. and Morichetti, F.; (2014) In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip. In: 2014 16th International Conference on Transparent Optical Networks (ICTON). IEEE, GBR. ISBN 9781479956005

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Official URL: https://doi.org/10.1109/ICTON.2014.6876541

Abstract

A high sensitivity in-band OSNR monitor system integrated on SOI platform is presented. The device exploits a narrow-band microring resonator to select the portion of the channel spectrum that is most sensitive to OSNR variations, and performs an autocorrelation measurement using a Mach-Zehnder interferometer. The proposed scheme allows in-line OSNR monitoring from 8 dB to 28 dB, with 0.2 dB accuracy.

ORCID iDs

Annoni, A., Melloni, A., Strain, M. J.

, Sorel, M. and Morichetti, F.;

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Item metadata

Item type:	Book Section
ID code:	49303
Dates:	Date Event 2014 Published
Keywords:	delay-line interferometer, in-band optical signal-to-noise ratio (OSNR), integrated optics devices, optical performance monitoring, silicon photonics, Electrical engineering. Electronics Nuclear engineering, Optics. Light, Computer Networks and Communications, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials
Subjects:	Technology > Electrical engineering. Electronics Nuclear engineering Science > Physics > Optics. Light
Department:	Faculty of Science > Physics > Institute of Photonics University of Strathclyde > University of Strathclyde
Depositing user:	Pure Administrator
Date deposited:	18 Sep 2014 16:01
Last modified:	20 Jan 2021 15:38
Related URLs:	Scopus publication
URI:	https://strathprints.strath.ac.uk/id/eprint/49303

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