Acceleration of ions up to 20MeV/nucleon in the ultrashort, high-intensity regime

Prasad, Ravikant G S V R.G.S.V. and Ter-Avetisyan, Sargis A. S.A. and Doria, Domenico D. and Quinn, K.E and Romagnani, L. and Zepf, M. and Borghesi, M. and Andreev, A. and Foster, P.S. and Brenner, C.M. and Gallegos, P.L. and Neely, D. and Green, J.S. and Streeter, M.J.V. and Carroll, D.C. and Tresca, O. and McKenna, P. and Dover, N.P. and Palmer, C.A.J. and Schreiber, J. and Najmudin, Z.; Ferroni, F. and Gizzi, L.A. and Faccini, R., eds. (2012) Acceleration of ions up to 20MeV/nucleon in the ultrashort, high-intensity regime. In: Laser-Plasma Acceleration. Proceedings of the International School of Physics . IOS Press, ITA, pp. 213-220. ISBN 9781614991281 (https://doi.org/10.3254/978-1-61499-129-8-213)

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Abstract

The measurements reported here provide scaling laws for the ion acceleration process in the regime of ultrashort (50 fs), ultrahigh contrast (1010) and ultrahigh intensity (> 1020W/cm 2), never investigated previously. The scaling of the accelerated ion energies was studied by varying a number of parameters such as target thickness (down to 10nm), target material (C and Al) and laser light polar- ization (circular and linear) at 35° and normal laser incidence. A twofold increase in proton energy and an order of magnitude enhancement in ion flux have been observed over the investigated thickness range at 35° angle of incidence. Further- more, at normal laser incidence, measured peak proton energies of about 20 MeV are observed almost independently of the target thickness over a wide range (50nm- 10 μm). 1.

ORCID iDs

Prasad, Ravikant G S V R.G.S.V., Ter-Avetisyan, Sargis A. S.A., Doria, Domenico D., Quinn, K.E, Romagnani, L., Zepf, M., Borghesi, M., Andreev, A., Foster, P.S., Brenner, C.M., Gallegos, P.L., Neely, D., Green, J.S., Streeter, M.J.V., Carroll, D.C., Tresca, O., McKenna, P. ORCID logoORCID: https://orcid.org/0000-0001-8061-7091, Dover, N.P., Palmer, C.A.J., Schreiber, J. and Najmudin, Z.; Ferroni, F., Gizzi, L.A. and Faccini, R.