High-sensitivity in-band OSNR monitoring on a silicon photonics platform

Morichetti, Francesco and Annoni, Andrea and Sharma, Ritu V. and Strain, Michael John and Sorel, Marc and Melloni, Andrea; (2013) High-sensitivity in-band OSNR monitoring on a silicon photonics platform. In: Advanced Photonics 2013. Optical Society of America. ISBN 9781557529817 (https://doi.org/10.1364/IPRSN.2013.IW5A.2)

Full text not available in this repository.Request a copy

Abstract

We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy.

ORCID iDs

Morichetti, Francesco, Annoni, Andrea, Sharma, Ritu V., Strain, Michael John ORCID logoORCID: https://orcid.org/0000-0002-9752-3144, Sorel, Marc and Melloni, Andrea;
  • Item type:Book Section
    ID code:47898
    Dates:
    Date
    Event
    1 December 2013
    Published
    Keywords:integrated optics devices, photonic integrated circuits, interferometry, optoelectronics, Optics. Light
    Subjects:Science > Physics > Optics. Light
    Department:Faculty of Science > Physics > Institute of Photonics
    Depositing user: Pure Administrator
    Date deposited:07 May 2014 14:46
    Last modified:19 Mar 2023 04:23
    Related URLs:
    URI:https://strathprints.strath.ac.uk/id/eprint/47898
CORE (COnnecting REpositories)