High-sensitivity in-band OSNR monitoring on a silicon photonics platform

Morichetti, Francesco and Annoni, Andrea and Sharma, Ritu V. and Strain, Michael John and Sorel, Marc and Melloni, Andrea (2013) High-sensitivity in-band OSNR monitoring on a silicon photonics platform. In: Advanced Photonics 2013. Optical Society of America. ISBN 9781557529817

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Abstract

We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy.

Author(s):Morichetti, Francesco, Annoni, Andrea, Sharma, Ritu V., Strain, Michael John, Sorel, Marc and Melloni, Andrea
Item type:Book Section
ID code:47898
Keywords:integrated optics devices, photonic integrated circuits, interferometry, optoelectronics, Optics. Light
Subjects:Science > Physics > Optics. Light
Department:Faculty of Science > Physics > Institute of Photonics
Depositing user: Pure Administrator
Date deposited:07 May 2014 14:46
Last modified:04 Jan 2019 11:50
Related URLs:
URI:https://strathprints.strath.ac.uk/id/eprint/47898
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