High-sensitivity in-band OSNR monitoring on a silicon photonics platform

Morichetti, Francesco and Annoni, Andrea and Sharma, Ritu V. and Strain, Michael John and Sorel, Marc and Melloni, Andrea; (2013) High-sensitivity in-band OSNR monitoring on a silicon photonics platform. In: Advanced Photonics 2013. Optical Society of America. ISBN 9781557529817

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Official URL: https://doi.org/10.1364/IPRSN.2013.IW5A.2

Abstract

We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy.

Creators(s):	Morichetti, Francesco, Annoni, Andrea, Sharma, Ritu V., Strain, Michael John ORCID: https://orcid.org/0000-0002-9752-3144, Sorel, Marc and Melloni, Andrea;
Item type:	Book Section
ID code:	47898
Keywords:	integrated optics devices, photonic integrated circuits, interferometry, optoelectronics, Optics. Light
Subjects:	Science > Physics > Optics. Light
Department:	Faculty of Science > Physics > Institute of Photonics
Depositing user:	Pure Administrator
Date deposited:	07 May 2014 14:46
Last modified:	23 Feb 2020 01:17
Related URLs:	Scopus publication
URI:	https://strathprints.strath.ac.uk/id/eprint/47898
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