High-sensitivity in-band OSNR monitoring on a silicon photonics platform
Morichetti, Francesco and Annoni, Andrea and Sharma, Ritu V. and Strain, Michael John and Sorel, Marc and Melloni, Andrea; (2013) High-sensitivity in-band OSNR monitoring on a silicon photonics platform. In: Advanced Photonics 2013. Optical Society of America. ISBN 9781557529817
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Abstract
We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy.
Creators(s): |
Morichetti, Francesco, Annoni, Andrea, Sharma, Ritu V., Strain, Michael John ![]() | Item type: | Book Section |
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ID code: | 47898 |
Keywords: | integrated optics devices, photonic integrated circuits, interferometry, optoelectronics, Optics. Light |
Subjects: | Science > Physics > Optics. Light |
Department: | Faculty of Science > Physics > Institute of Photonics |
Depositing user: | Pure Administrator |
Date deposited: | 07 May 2014 14:46 |
Last modified: | 01 Jan 2021 06:47 |
Related URLs: | |
URI: | https://strathprints.strath.ac.uk/id/eprint/47898 |
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