High-sensitivity in-band OSNR monitoring on a silicon photonics platform

Morichetti, Francesco and Annoni, Andrea and Sharma, Ritu V. and Strain, Michael John and Sorel, Marc and Melloni, Andrea; (2013) High-sensitivity in-band OSNR monitoring on a silicon photonics platform. In: Advanced Photonics 2013. Optical Society of America. ISBN 9781557529817 (https://doi.org/10.1364/IPRSN.2013.IW5A.2)

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Abstract

We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy.

ORCID iDs

Morichetti, Francesco, Annoni, Andrea, Sharma, Ritu V., Strain, Michael John ORCID logoORCID: https://orcid.org/0000-0002-9752-3144, Sorel, Marc and Melloni, Andrea;
CORE (COnnecting REpositories)