Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis
Binti Ab Aziz, Nur Hakimah and Judd, Martin and Catterson, Victoria; (2013) Identifying Prognostic Indicators for Electrical Treeing in Solid Insulation through PD Analysis. In: 11th IEEE International Conference on Solid Dielectrics (ICSD). IEEE, ITA, pp. 152-155. ISBN 9781479908073 (https://doi.org/10.1109/ICSD.2013.6619720)
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Abstract
This paper presents early results from an experimental study of electrical treeing on commercially available pre-formed silicone samples. A needle-plane test arrangement was set up using hypodermic needles. Partial discharge (PD) data was captured using both the IEC 60270 electrical method and radio frequency (RF) sensors, and visual observations are made using a digital microscope. Features of the PD plot that corresponded to electrical tree growth were assessed, evaluating the similarities and differences of both PD measurement techniques. Three univariate phase distributions were extracted from the partial discharge phase-resolved (PRPD) plot and the first four statistical moments were determined. The implications for automated lifetime prediction of insulation samples due to electrical tree development are discussed.
ORCID iDs
Binti Ab Aziz, Nur Hakimah ORCID: https://orcid.org/0000-0002-0578-0806, Judd, Martin and Catterson, Victoria ORCID: https://orcid.org/0000-0003-3455-803X;-
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Item type: Book Section ID code: 46587 Dates: DateEventJune 2013PublishedSubjects: Technology > Electrical engineering. Electronics Nuclear engineering Department: Faculty of Engineering > Electronic and Electrical Engineering Depositing user: Pure Administrator Date deposited: 27 Jan 2014 12:23 Last modified: 15 Sep 2024 00:34 URI: https://strathprints.strath.ac.uk/id/eprint/46587