Spectroscopic ellipsometry measurements on an anisotropic organic crystal : potassium acid phtalate

Tools

Sassella, Adele and Tubino, Riccardo and Borghesi, Alessandro and Giardini, Mario Ettore and Quadrelli, Lorenzo (1998) Spectroscopic ellipsometry measurements on an anisotropic organic crystal : potassium acid phtalate. Thin Solid Films, 313-314 (13 Feb). pp. 347-350. ISSN 0040-6090 (https://doi.org/10.1016/S0040-6090(97)00844-4)

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Abstract

Spectroscopic ellipsometry in the range from 300 to 800 nm is applied for the determination of the optical properties of potassium acid phtalate crystals, of particular interest for their use as substrates for the epitaxial deposition of highly oriented polymers. The study is based on the analysis of measurements performed on differently oriented samples at different angles of incidence. Such measurements are used to reduce uncertainty in the analysis.

ORCID iDs

Sassella, Adele, Tubino, Riccardo, Borghesi, Alessandro, Giardini, Mario Ettore ORCID logoORCID: https://orcid.org/0000-0003-4849-9683 and Quadrelli, Lorenzo;
CORE (COnnecting REpositories)