Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique

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Ding, Wei and Gorbach, Andriy V and Wadswarth, W.J. and Knight, Jonathan C and Skryabin, D.V. and Strain, Michael and Sorel, M. and De La Rue, R.M. (2010) Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique. Optics Express, 18 (25). pp. 26625-26630. (https://doi.org/10.1364/OE.18.026625)

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Abstract

We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive (Cherenkov) waves emitted by solitons into the wavelength range of normal group velocity dispersion.

ORCID iDs

Ding, Wei, Gorbach, Andriy V, Wadswarth, W.J., Knight, Jonathan C, Skryabin, D.V., Strain, Michael ORCID logoORCID: https://orcid.org/0000-0002-9752-3144, Sorel, M. and De La Rue, R.M.;
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