Contact effects in Gunn diodes

Gurney, William (1971) Contact effects in Gunn diodes. Electronics Letters, 7 (24). pp. 711-713. ISSN 0013-5194 (https://doi.org/10.1049/el:19710488)

Abstract

This letter shows how the splitting of the forward and reverse current/voltage curves of a Gunn diode may be interpreted in terms of different models of contact damage, and proposes a simple test technique to obtain a quantitative measure of contact quality. Experimental verification of this technique is presented, showing a correlation between device efficiency and a contact parameter ß.

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• Item metadata

  Item type:	Article
  ID code:	41360
  Dates:	Date Event 2 December 1971 Published
  Subjects:	Technology > Electrical engineering. Electronics Nuclear engineering
  Department:	Faculty of Science > Mathematics and Statistics
  Depositing user:	Pure Administrator
  Date deposited:	09 Oct 2012 09:59
  Last modified:	11 Nov 2024 10:14
  URI:	https://strathprints.strath.ac.uk/id/eprint/41360