Vulnerability of Zigbee to impulsive noise in electricity substations

Bhatti, Shahzad Ahmed and Shan, Qingshan S. and Atkinson, Robert and Vieira, M. and Glover, Ian; (2011) Vulnerability of Zigbee to impulsive noise in electricity substations. In: General assembly and scientific symposium, 2011 XXXth URSI Proceedings. Institute of Electrical and Electronic Engineers, TUR, pp. 1-4. ISBN 9781424451173 (https://doi.org/10.1109/URSIGASS.2011.6050729)

Abstract

The vulnerability of Zigbee technology to noise in an electricity substation environment is assessed. Substation noise obtained from a measurement campaign is modelled as a Symmetric α-Stable process. The parameters of the model are estimated from the measurements and the resulting model is used to investigate the likely BER performance of Zigbee technology deployed in a substation.

ORCID iDs

Bhatti, Shahzad Ahmed ORCID: https://orcid.org/0000-0001-8318-632X

Atkinson, Robert ORCID: https://orcid.org/0000-0002-6206-2229

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  Item type:	Book Section
  ID code:	40294
  Dates:	Date Event October 2011 Published
  Keywords:	vulnerability, zigbee, impulse noise, electricity substations, bit error rate, electricity, noise, receivers, substations, wireless sensor networks, Electrical engineering. Electronics Nuclear engineering
  Subjects:	Technology > Electrical engineering. Electronics Nuclear engineering
  Department:	Faculty of Engineering > Electronic and Electrical Engineering
  Depositing user:	Pure Administrator
  Date deposited:	02 Jul 2012 10:55
  Last modified:	20 Jan 2021 15:26
  Related URLs:	Scopus publication http://ieeexplore.ieee.org/stamp/stamp.j...
  URI:	https://strathprints.strath.ac.uk/id/eprint/40294