Vulnerability of Zigbee to impulsive noise in electricity substations

Bhatti, Shahzad Ahmed and Shan, Qingshan S. and Atkinson, Robert and Vieira, M. and Glover, Ian; (2011) Vulnerability of Zigbee to impulsive noise in electricity substations. In: General assembly and scientific symposium, 2011 XXXth URSI Proceedings. Institute of Electrical and Electronic Engineers, TUR, pp. 1-4. ISBN 9781424451173

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Abstract

The vulnerability of Zigbee technology to noise in an electricity substation environment is assessed. Substation noise obtained from a measurement campaign is modelled as a Symmetric α-Stable process. The parameters of the model are estimated from the measurements and the resulting model is used to investigate the likely BER performance of Zigbee technology deployed in a substation.

Creators(s): Bhatti, Shahzad Ahmed ORCID logoORCID: https://orcid.org/0000-0001-8318-632X, Shan, Qingshan S., Atkinson, Robert ORCID logoORCID: https://orcid.org/0000-0002-6206-2229, Vieira, M. and Glover, Ian;
Item type:Book Section
ID code:40294
Keywords:vulnerability, zigbee, impulse noise, electricity substations, bit error rate, electricity, noise, receivers, substations, wireless sensor networks, Electrical engineering. Electronics Nuclear engineering
Subjects:Technology > Electrical engineering. Electronics Nuclear engineering
Department:Faculty of Engineering > Electronic and Electrical Engineering
Depositing user: Pure Administrator
Date deposited:02 Jul 2012 10:55
Last modified:20 Jan 2021 15:26
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URI:https://strathprints.strath.ac.uk/id/eprint/40294
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