Vulnerability of Zigbee to impulsive noise in electricity substations
Bhatti, Shahzad Ahmed and Shan, Qingshan S. and Atkinson, Robert and Vieira, M. and Glover, Ian; (2011) Vulnerability of Zigbee to impulsive noise in electricity substations. In: General assembly and scientific symposium, 2011 XXXth URSI Proceedings. Institute of Electrical and Electronic Engineers, TUR, pp. 1-4. ISBN 9781424451173 (https://doi.org/10.1109/URSIGASS.2011.6050729)
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The vulnerability of Zigbee technology to noise in an electricity substation environment is assessed. Substation noise obtained from a measurement campaign is modelled as a Symmetric α-Stable process. The parameters of the model are estimated from the measurements and the resulting model is used to investigate the likely BER performance of Zigbee technology deployed in a substation.
ORCID iDs
Bhatti, Shahzad Ahmed ORCID: https://orcid.org/0000-0001-8318-632X, Shan, Qingshan S., Atkinson, Robert ORCID: https://orcid.org/0000-0002-6206-2229, Vieira, M. and Glover, Ian;-
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Item type: Book Section ID code: 40294 Dates: DateEventOctober 2011PublishedSubjects: Technology > Electrical engineering. Electronics Nuclear engineering Department: Faculty of Engineering > Electronic and Electrical Engineering Depositing user: Pure Administrator Date deposited: 02 Jul 2012 10:55 Last modified: 11 Nov 2024 14:49 Related URLs: URI: https://strathprints.strath.ac.uk/id/eprint/40294