Modelling shading on amorphous silicon single and double junction modules
Johansson, A. and Gottschalg, R. and Infield, D.G. (2003) Modelling shading on amorphous silicon single and double junction modules. In: 3rd World Conference on Photovoltaic Energy Conversion, 2003-05-11 - 2003-05-18.
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The effect of shading amorphous silicon mini-modules is investigated by means of measurements and simulation. Several devices are measured under varying degrees of shading and the reverse bias behaviour is investigated, including the reverse breakdown voltage. A simulation using a modified single diode model for amorphous silicon is presented, in which the Bishop extension of the shunt resistance is used to simulate the behaviour of shaded devices. The differences between the effect of shading on amorphous silicon and on crystalline silicon devices are investigated based on measurements and simulations. It is shown that the thin film cells do not develop hot spots in the same manner as crystalline silicon devices; they always break down at the interconnection to the adjacent cell.
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Item type: Conference or Workshop Item(Paper) ID code: 39393 Dates: DateEventMay 2003PublishedSubjects: Technology > Electrical engineering. Electronics Nuclear engineering Department: Faculty of Engineering > Electronic and Electrical Engineering Depositing user: Pure Administrator Date deposited: 25 Apr 2012 15:21 Last modified: 11 Nov 2024 16:20 URI: https://strathprints.strath.ac.uk/id/eprint/39393