Bit pattern dependent effect reduction in all-optical 3R regeneration
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Glesk, I. and Wang, B.C and Xu, L. and Zhou, Dujin and Runser, Robert J. and Prucnal, P.R. (2001) Bit pattern dependent effect reduction in all-optical 3R regeneration. In: 3rd Electronic Circuits and Systems Conference, 2001-09-05 - 2001-09-07.
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This paper looks at bit pattern dependent effect reduction in all-optical 3R regeneration
ORCID iDs
Glesk, I. ORCID: https://orcid.org/0000-0002-3176-8069, Wang, B.C, Xu, L., Zhou, Dujin, Runser, Robert J. and Prucnal, P.R.;-
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Item type: Conference or Workshop Item(Paper) ID code: 37595 Dates: DateEventSeptember 2001PublishedSubjects: Technology > Electrical engineering. Electronics Nuclear engineering Department: Faculty of Engineering > Electronic and Electrical Engineering Depositing user: Pure Administrator Date deposited: 11 Feb 2012 05:21 Last modified: 11 Nov 2024 16:20 URI: https://strathprints.strath.ac.uk/id/eprint/37595
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